All Chassis and Controllers Products. ROM Emulator Instrumentation. Digital Multimeter Instrumentation. Counter Timer Instrumentation. Digitizer Instrumentation. All Measurement Products. Arbitrary Function Generators. Standards Source Instrumentation. Multi-function Instrumentation.
All Stimulus Products. High Current. High Density. General Purpose. All Switching Products. Power Supplies. Power Supply Mainframe and Modules Instrumentation. Precision DC Source Instrumentation. All Power Supplies Products. Bus Interfaces. Bus Expanders. ARINC All Bus Interfaces Products. Wavetek Replacements. HP Replacements. PXI Instruments. Chassis and Controllers. FPGA Cards. All Legacy Products. Test Executive and Development Studio Software development environment and integrated, customizable Test Executive for execution, sequencing, debugging and fault analysis of tests Comprehensive simulation capabilities accelerates test program development and deployment User interface generation including form editor, event programming, menus, and controls Open architecture supports external software and hardware interfaces: DLL and C header files,.
What's New? Knowledge Base. Related Items. Description ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems.
ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles.
With ATEasy, test applications are faster to generate and easier to maintain. For OEM suppliers of test systems, ATEasy-Lite offers a cost-effective, full-featured, test executive and test development software suite that can be bundled with the supplier's ATE systems.
Why Use ATEasy? ATEasy provides the test engineer with a multitude of benefits, including: Integrated Framework ATEasy provides a streamlined, easy-to-follow framework that directs the user to create re-usable components modeled after real-world test systems.
Re-usability and Scalability The ATEasy framework provides users with the ability to create re-usable software components such as instrument drivers, system components and test programs. These components can be reused from system to system reducing the overall cost of creating and maintaining an application.
User group customization and assignments of privileges is easily done with little or no programming. All the tools to execute, create datalogs, and debug your tests are included. Additional modules are included that provide test sequencing and fault analysis. First time users can use the Application Wizard to generate applications quickly. The ATEasy application framework and modular structure offer placeholders for your code reducing the learning curve.
During debugging, ATEasy's Just-In-Time compiler compiles only the necessary code as required, supporting fast development cycles. ATEasy allows you to write several lines of code, highlight them and then click on the DoIt!
Fast and Easy Programming Applications can be created via menu commands or by typing. Commands can be combined with ATEasy language statements such as if, repeat, etc. When typing, ATEasy's code completion tools provide suggestions for completing the unfinished statements, and an integrated code verification utility, CheckIt!
Application wizards help you create a framework for your test application and ATEasy's modular structure allows engineers to partition, organize, locate and re-use the test code. A built-in code browser offers immediate access to symbols such as functions or variable definitions.
The ATEasy internal library includes many classes and functions providing support for your software components such as drivers, tests, forms and controls, and for basic operations such as math, string manipulation, communication, etc. Multi threading Support ATEasy provides full support for the Windows multi threading model, which allows users to execute multiple code segments simultaneously. Synchronizing objects such as semaphores and events allows users to synchronize thread execution to protect your application resources from re-entrance.
The commands can be implemented differently for different instruments of the same type. Consequently, when instruments need to be replaced, a new instrument driver may be used while the test programs remain unchanged.
You can create and watch variables and expression values, execute code in a debug window, view a call stack , and view a running thread. In addition, ATEasy includes test level debugging tools allowing you to select and run tests, loop on tests, skip tests, pause on a failed test, and repeat a test. Once the test executive is inserted to your project, your application has a complete test executive user interface that allows selecting and running a test program, debugging, viewing and printing test logs.
Plug-in modules can also be added to the test executive for added functionality. ATEasy Test Executive. The development environment includes modules in a hierarchical and layered structure as shown in the tree view. Engineers can use the pre-defined structure as a template to partition and develop a test program. During debugging, integration, or maintenance, this modular structure simplifies the process by isolating problems.
Application framework components are displayed in an easy-to-browse tree view that serves as a basis for the application specific components. ATEasy Application Wizard. A Task sub-module includes a group of Test sub-modules, which test a block cicuitry or logical unit of the Unit Under Test. Various test types are built in such as Min-Max, where the result must fall within a required Minimum and Maximum value.
The test code is responsible of taking measurements and assigning it to a Test Result, an internal ATEasy variable. When the test code is executed, the TestResult will be used to calculate the test status: Pass or Fail and together with the test information the test log will be automatically generated. The users can easily insert them into Test sub-modules instead of entering manually.
The test code is "partitioned" into the appropriate sub-modules depending on whether it is UUT specific Program , system specific System , or instrument specific Driver. ATEasy Workspace Window. Form Editor Window.
In addition, ATEasy provides various tools to support rapid creation and debugging of instrument drivers. We always like to hear from you of new ideas and features you would like to see in ATEasy!
Please submit your request or feedback using our Web Support Page. ATEasy The following list describes the main changes in this version: Revamped IDE user interface - New tabbed user interface to include improved layout, colored tabs, multi-tab panes, and improved sizing and docking. See KBase article for more information. See also the ATEasy preview presentation in the Tutorials tab. The following list describes the main changes in this version: Much Faster Run-Time — up to 10x faster in benchmark tests.
Net Controls Support — import and integrate external, widely-available. Users can ask for or upload their drivers. NET Assemblies 1. Q Dec 20, Q Mar 9, Multisite Digital Test System Design The following article discusses the relative merits of two types of multi-site digital semiconductor test system designs.
Q Jun 1, Q Apr 8, Appending Multiple Digital Test Patterns to Reduce Test Time The following article describes how to streamline a digital application by merging digital test patterns into one compressed file that can be loaded once and accessed for each digital test. Learn more about our Privacy Policy and Terms of Use. Core Test System TS Digital Test System TS Hellfire Missile Simulator MT Waveform Analysis Suite WaveEasy.
All Software Products. Chassis Controllers and Bus Expanders. All Chassis and Controllers Products. ROM Emulator Instrumentation. Digital Multimeter Instrumentation. Counter Timer Instrumentation. Digitizer Instrumentation. All Measurement Products. Arbitrary Function Generators. Standards Source Instrumentation. Multi-function Instrumentation. All Stimulus Products. High Current. High Density. General Purpose.
All Switching Products.
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